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Session and scheduling information are listed below. Select a session from the list and press "Go" to view the abstracts for that session.

Poster Session :
Display Measurement Posters

Thursday, May 16, 2024, 5:00 PM – 8:00 PM / San Jose Convention Center, Room 220A


P.114 - A Method for Visualizing and Quantifying Color Differences Using Relative Hue and Relative Color Concentration
  • Han-Yan Sun, Xiao-Hu Li, Wei-Tao Chen, Xiao-Peng Cui, Jian-Guo Xing
    Beijing BOE Display Technology Co., Ltd. Beijing China



  • An innovative method is proposed for visualizing and quantifying color difference using relative hue and color saturation. The new method avoids issues with chromaticity-based methods and subjective assessment. The relationship between color difference and panel characteristics for two a-Si displays is presented.

P.115 - Optimized Method for Sparkle Contrast Measurement of Anti-Glare Covered Vehicle Display
  • Li Song, Jiangen Pan, Peipei Li
    Everfine Corporation Hangzhou China


  • Liangcai Cao
    Tsinghua University Beijing China



  • The authors present an optimized method for evaluating the visual sparkle contrast of vehicle displays with anti-glare treatments and compare the results to standard test methods. By assessing the sparkle contrast changes under different ambient light conditions and different viewing angle conditions, they provide test recommendations for the sparkle evaluation of vehicle displays.

P.116 - A Demoiré Method for Display Test Using CNN Model with Pixel Shift
  • Hao Tang, Wuxing Zhang, Gang Xu
    Jingce Electronic USA San Jose CA US



  • A deep-learning-based demoiré algorithm is applied to display test images to remove moiré patterns. The ground truth is generated by a pixel shift (PS) method implemented by shifting the display panels, instead of the camera sensor, a low-cost alternative to expensive PS cameras for mass production.

P.117 - A Demura Method for OLED under White Image with Monochrome Camera
  • Hao Tang, Cody Yu, Pengcheng Xu, Gang Xu
    Jingce Electronic USA San Jose CA US



  • A demura method using a high-resolution monochrome camera is proposed for OLED panels, enabling a single data capture for white images at each gray level (GL). The authors' method minimizes takt time for low GL images because of its efficient utilization of light compared to demura methods using a Bayer pattern color camera.

P.119 - Evaluating Seamlessness: A Quantitative Index for Transparent Tiled MicroLED Displays
  • YuTang Tsai, MinChun Huang, ChangHung Li, ShengYuan Chiou, KunCheng Tien, YenWen Fang, MingHsien Lee, MingLiang Shao
    AUO Corporation Hsinchu Taiwan Roc



  • This study uses the validated structural similarity (SSIM) index method for accurately evaluating the quality of splicing seams in tiled transparent microLED displays. This method, which avoids subjective human observation, enables precise feedback in the production process and establishes common objective measurement standards for defining splicing seam quality.

P.243 Late-News Poster: Polarization State Maps Measurement of Optical Components Using a Fourier Optic-Based Conoscope
  • Véronique Collomb-Patton, Thierry Leroux
    ELDIM SA. Hérouville St Clair France



  • Polarization states out of SiO2 waveplates and LYOT depolarizers are measured using a Fourier angular system. The authors show that the measurements perfectly match the theory of birefringence at any incident angle. The equipment can furthermore be used to obtained a cartography of the polarization states out of VR optical systems.