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| From 10 to 11 April 2024, the who's who of the display industry will once again meet in Nuremberg (Germany) for the electronic displays Conference 2024 (edC). Instrument Systems will be part of the top-notch information with a live talk and a poster performance about our light measurement solutions. Get more details in the articles below.
The conference program covers all important topics along the entire display value chain, from science and materials research to production, integration, sales and users. With this fully packed lineup the edC 2024 again serves as the most important European B2B platform for all important display applications.
Take your chance and register now !
We also like to point out our participation in Touch Taiwan and in SID Display Week 2024. You will find more info below and in our next newsletter.
Your Instrument Systems Team
sales@instrumentsystems.com
Tel.: +49-89-454943-0
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| New Managing Director at Instrument Systems
| | On 2 April 2024 the position of the Managing Director passes from Yasumasa Kuboyama to Dr. Yuta Yamanoi, who together with CEO Dr. Markus Ehbrecht will form the new Instrument Systems management team.
In this new role he will further strengthen the cooperation between the Konica Minolta subsidiaries of the Sensing Business Unit with its Light & Display and Color & Appearance division, which also includes Instrument Systems.
His predecessor Yasumasa Kuboyama will be moving back to Japan to take over a new department in Konica Minolta Sensing business unit.
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| | | \\ edC 2024, Nuremberg (Germany) |
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| TALK: Live Colorimeter Calibration Adapts to Spectral Variations of the Measurement Object | |
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| In principle, all colorimeters need color calibration, because the color filters that are used to mimic the eye’s sensitivity to visible light will never perfectly match the theoretical CIE 1931 functions. Calibration to a standard light source improves measurement accuracy, but especially for most new and often immature display and lighting technologies, e.g. µLED and AR/VR does not provide adequate accuracy.
For example, small variations in µLED current density, temperature and manufacturing tolerances will change the spectral properties and may render the colorimeters calibration invalid. Hence, measurement uncertainty increases. This can lead to erroneous pass/fail decisions in display and LED manufacturing.
Instrument Systems has developed a measurement device that adapts its calibration on-the-fly in accordance to the “live” spectral changes of the DUT. We discuss experiments to demonstrate the accuracy and robustness of this concept for displays, LEDs and µLED wafers.
Live talk by Dr. Tobias Steinel
on Wednesday, April 10, 2024, 1:20 PM
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| POSTER: Matching One-Shot Imaging Light Measurement Devices with Goniophotometer Measurements in VR Applications | |
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| A goniophotometer frequently acts as a gold standard in measuring XR components or headsets. The benefit of precise spectrometer results are normally correlated with longer measurement times. On the other side, imaging light measurement devices (ILMD) offer the possibility of one-shot measurements with short measurement times which make ILMD ideal for mass production with short cycle time. To connect the measurements of ILMD and gonio-photometer some pitfalls have to be considered.
Instrument Systems´ poster shows measurement data obtained with ILMD and goniophotometer of an optical module (consisting of pancake optics and an OLED display used in VR headsets). Comparability of both approaches is possible due to the traceability of reference spectrometers in both, goniophotometer and ILMD.
Poster session with Dr. Sascha Reinhardt,
daily within the conference program:
April 10 – 11, 2024
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| | TALK: High Resolution and Metrologically Traceable Characterization of Semiconductor Lasers at SWIR Wavelength with InGaAs Sensors | |
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| We introduce a measurement setup for complete LIV measurements, including spectral analysis, of SWIR semiconductor lasers. The setup combines a high-resolution array spectrometer and a sensitive photodiode with a high reflectance integrating sphere. State-of-the-art calibration ensures metrological traceability to the SI-system of units for all measurement results. The influence of the temperature on the laser performance, characteristics and properties is thoroughly analyzed. Extension and further automatization of our measurement routine is required to facilitate the semiconductor lasers development as well as to speed up the industrialization of the semiconductor lasers.
SPIE Photonics Europe, Strasbourg (France)
Presented by Dr. Amir Sharghi (13002-29)
April 11, 2024, 1:40 PM
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| | Touch Taiwan 2024 - Visit us at Booth L318! | |
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| Visit us at Touch Taiwan, held April 24 - 26, 2024 in Taipei. Together with our partner Rapitech Enterprise, Instrument Systems shows proven and new solutions for a wide range of light measurement applications:
- AR/VR head mounted display testing and display measurements with LumiTop imaging cameras
- DMS goniometers for display measurements
- Spectroradiometers for high resolution measurements from UV to IR
We look forward to your visit at Booth L318!
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| | \\ Display Metrology Training Course, SID Display Week 2024, USA
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| | | | Fundamentals of Display Metrology | |
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| This Display Metrology Training course will provide a fundamental understanding of display metrology and introduce measurement equipment and techniques from leaders in the field. Topics include the science of light and color, units of measurement, measurement standards, metrology systems from spot meter spectroradiometers to advanced imaging systems. The course will introduce test methods to address display performance parameters from mura to pixel uniformity. Metrology solutions for state-of-the-art testing applications are presented, ranging from curved displays to microLED panels and complete AR/VR devices.
Presented by Dr. Ferdinand Deger, Instrument Systems and Jens Jensen, Radiant Vision Systems
Sunday, May 12 (AM session).
Register now - participation is subject to a fee!
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