  | |  | Dear Melanie
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| Stay ahead in optical metrology with our latest software updates, expert insights, and event news.
In this issue, discover powerful new features in SpecWin Pro 5.0, gain practical insights into efficient MicroLED testing, and watch our new video on how to perform an audit with a LumiTop system.
We also invite you to meet us in person at SPIE AR/VR/MR and Photonics West in San Francisco in early 2026.
Any questions? Please don't hesitate to contact us!
Your Instrument Systems Team
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\\ Powerful Software Optimizations: SpecWin Pro 5.0 Release |
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| | | | The new SpecWin Pro 5.0 expands the goniometer module with several key features for more precise and flexible light measurement:
- Sequence Calculator: Combine multiple measurement sequences with different DUT orientations for complete characterization of complex luminaires.
- Enhanced data handling: Improved plane interpolation and export in EULUMDAT (LDT) and IES (IESNA LM-63); UGR calculation aligned with Relux and CIE 190:2010.
- Efficient VCSEL measurements: Safe, fast testing with SMU control via the graphical user interface – no external programming needed.
- AR/VR display support: Fully integrated TOP300 accessory, including View Finder Camera for precise spot alignment.
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\\ Video: MicroLED Testing Talk |
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| | | | | | High Accuracy Optical Metrology for MicroLED Displays and Wafers | | Dr. Tobias Steinel demonstrated at MicroLED Connect 2025 how traceable optical measurement methods using electroluminescence (EL) and photoluminescence (PL) improve efficiency across the entire MicroLED value chain – from single MicroLEDs to full wafers.
Our high-speed imaging systems provide fast and reliable results at every stage.
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| | | | | | Verifying Imaging Colorimeter & Spectroradiometer Performance | | Discover how to perform a professional on-site audit of your LumiTop imaging colorimeter system to ensure traceable, stable and reliable measurement results.
The video demonstrates:
- Verification of camera uniformity and overall system performance.
- Comparison of CAS spectroradiometer measurements with ACS reference calibration.
- Fully automated, traceable audit process using ACS 150 & ACU 100.
- Improved long-term stability with minimized system downtime.
Maintain confidence in your display measurement systems with a dedicated audit setup combining LumiTop, CAS 140D and the ACS Audit Tool software.
Learn more about Audit for cameras and spectrometers here.
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\\ Trade Shows January 2026
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| | | | | | Meet us at SPIE Photonics West & SPIE AR/VR/MR 2026 | |
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| From 17 to 22 January 2026, we will be present at two major industry events in San Francisco:
- SPIE Photonics West at the German Pavilion (Booth #4205-60)
- SPIE AR/VR/MR together with Konica Minolta and Radiant Vision Systems (Booth #6501)
We will showcase our latest solutions for XR applications.
Also, don't miss our talk "Impact of backgrounds on virtual image quality in AR glasses" by our XR metrology specialist Dr. Sascha Reinhardt.
More details will follow in a dedicated newsletter.
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