Newsletter October 2025 
Instrument Systems
Advancing Display Metrology
Dear Bei-Bei
Whether in vehicle laboratories or display and wafer production, precise optical metrology is key to ensuring quality and efficiency.
 
In this issue, we present two highlights from Instrument Systems:
our new stand-alone screen photometer for headlamp testing, and the LumiTop series for fast and accurate MicroLED and MicroOLED measurements.
 
We also invite you to join us at the MicroLED Forum 2025 in Taipei, where our expert Dr. Thomas Attenberger will share the latest insights into traceable color measurement for MicroLED applications.
 
 
Any questions? Please don't hesitate to contact us!
 
Your Instrument Systems Team
 
Contact us

\\ New: Stand-Alone Screen Photometer
STA system
Our new stand-alone screen photometer provides a cost-efficient solution for testing headlamp light distribution directly in the complete vehicle setup under laboratory conditions. It delivers reliable, reproducible results and integrates seamlessly into existing test environments.
 
System components:
  • Large-area calibration source with flexible traversing system
  • Projection screen
  • 12-megapixel LumiCam 4000B imaging photometer
  • Test and evaluation software
 
Learn more

\\ High-Speed MicroLED Testing with LumiTop & LumiSuite
LumiTop4000Macro
The LumiTop series together with LumiSuite software enables high-speed, precise testing of MicroLED wafers, arrays and displays. With camera sensors up to 150 MP and adaptive live calibration using a CAS spectrometer, LumiTop delivers traceable, pixel-level accuracy for production environments.
 
Highlights:
  • Parallel testing of thousands or millions of MicroLEDs
  • Easy integration into production lines
  • Absolute calibration to national standards
 
Learn more

\\ Event: MicroLED Forum 2025 in Taipei
MicroLEDForum
Join us on 12 November 2025, at the MicroLED Forum in Taipei, which we will attend together with our partner Rapitech Enterprise.
Our expert Dr. Thomas Attenberger will give a presentation on “Traceable and Accurate Color Measurement at MicroLED Wafers”,
offering insights into the latest developments in precise color metrology for MicroLED wafers.
 
Register here

\\ Expert Talk at MicroLED Forum 2025

Thomas Attenberger
Traceable and Accurate Color Measurement at MicroLED Wafers

 
Presenter: Dr. Thomas Attenberger
Date: 2025/11/12
Location: Taipei, Taiwan
 
MicroLEDs are making their way into many applications in high-quality displays. Testing at an early stage helps manufacturers ensure best performance in color and luminance homogeneity right from the start of production. Instrument Systems has developed a high-end test camera dedicated to highest photometric and colorimetric test accuracy even for the smallest MicroLEDs. The camera is referenced to a high-accuracy spectrometer of the CAS 140D series, which guarantees traceability to international standards. Special calibration algorithms have been developed to take spectral variations of the individual emitters into account and ensure accurate, reproducible results. In combination with an optical excitation system, complete MicroLED wafers can be analyzed in color and luminance within minutes. In this presentation, we will share first results that demonstrate how this approach helps manufacturers achieve reliable quality and efficiency in MicroLED production.
 
Register here
 
 
 
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