  | |  | Dear Bei-Bei
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| In March 2026, Instrument Systems will participate in several major industry events in Europe and China, contributing technical presentations, poster sessions, and live demonstrations focusing on advanced display and near-eye display metrology.
Join our experts to gain insights into the latest measurement challenges, such as curved automotive displays, multiple color matching functions, and AR display characterization. We will also present our latest metrology solutions and share new findings from our recent whitepaper on virtual image quality in AR glasses.
Any questions? Please don't hesitate to contact us!
Your Instrument Systems Team
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\\ electronic displays Conference (edC) 2026
10–12 March 2026, NCC Ost Convention Centre, Messe Nuremberg, Germany |
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At edC 2026, held alongside embedded world, we will contribute with a talk and a poster session addressing advanced display measurement challenges.
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Presentation
Challenges with Goniometric Characterization of Curved Displays
Presenter: Matthias Lobitz
Date: 11 March 2026 | 2:40 p.m.
With the increasing adoption of curved displays in automotive applications, precise optical characterization becomes significantly more complex. The presentation introduces a novel approach combining coordinate transformation algorithms, a 7-axis goniometer, and an advanced temperature chamber concept to enable accurate angular measurements under geometric and thermal constraints.
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Poster session
2D Display Testing with Multiple Color Matching Functions
Date: 11 & 12 March 2026
In 1931, the CIE introduced the “standard observer” as the first standardized model of human color perception, still used in display metrology today. New wide-gamut display technologies, however, can appear differently when measured with the CIE 1931 2° Color Matching Function (CMF). That’s why manufacturers use alternative or custom CMFs to achieve consistent appearance across display types. Instrument Systems’ LumiTop devices enable easy switching between CMFs without hardware changes and allow parallel measurements with multiple CMFs.
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Join us at edC 2026 to discover how our solutions make accurate display measurement easier and more reliable.
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\\ Laser World of Photonics China 2026 |
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| | | | | 18–20 March 2026, Shanghai, China
Booths E7.7466 & E7.7536 | | Join us at our booths as we present our latest metrology innovations in collaboration with Konica Minolta and Rapitech Enterprise.
At booth E7.7466, together with Konica Minolta, we will showcase the new LumiTop X30 AR, specifically designed for production testing of near-eye displays in AR/VR headsets.
Our high-precision optical measurement solutions for LED/IRED, wafer, and display testing will be displayed at booth E7.7536 together with Rapitech Enterprise.
Come by and discuss with our experts solutions for precise optical characterization across a wide range of display and (micro)LED applications.
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\\ ALE (Shanghai International Auto Lamp Exhibition) |
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| | | | | 25 – 27 March 2026, Huaqiao International Expo Center, Shanghai, China
Booth C311, Hall C | | The International Auto Lamp Exhibition is the world’s largest event focused solely on automotive lighting, serving as a platform for technical exchange and product showcase. It brings together leading experts and companies to present innovations, discuss trends, and share the latest advancements.
We will showcase together with our partner LucidBright Technology. the STA Screen Photometer System for vehicle-based headlight testing and the AMS goniometer series, now also available for very large test objects. Visit our booth to explore the latest automotive lighting measurement solutions and meet our experts on-site.
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\\ ICDT 2026
31 March – 3 April 2026, Chongqing International Expo Center, China
Booth 6B2 |
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| | At ICDT 2026, we will present our latest display and near-eye display metrology solutions together with Konica Minolta and Radiant Vision Systems.
Our technical program includes several presentations covering key aspects of AR and display characterization, including:
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Visit our booth to discuss your specific measurement challenges and learn how our solutions support accurate and reliable display characterization.
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| | | | | Impact of Backgrounds on Virtual Image Quality in AR Glasses
Dr. Sascha Reinhardt | | Optical see-through AR promises seamless overlays, yet real-world backgrounds reshape contrast, color, and uniformity of the virtual image. Using calibrated photometric and colorimetric measurements and additive color-mixing analysis, we quantify how luminance, chromaticity, and spatial structure influence the virtual image.
Learn key trade-offs between visibility and transparency - and optimization guidance for AR systems.
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