  | |  | Dear Bei-Bei
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| Kick off 2026 with new developments in optical metrology and discover where you can meet us in the coming weeks!
In this issue, we introduce you to our new LumiTop X30 AR – an advanced camera system for precise characterization of near-eye displays used in AR glasses. In addition, we share what you can expect from us at SPIE Photonics West and SPIE AR/VR/MR 2026 in San Francisco. We also provide a short outlook on the DVN Workshop in Munich and the Asia Photonics Expo (APE) in Singapore.
Any questions? Please don't hesitate to contact us!
Your Instrument Systems Team
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\\ SPIE AR/VR/MR 2026 – Launch of “LumiTop X30 AR”
17–22 January 2026, Moscone Center, San Francisco
Booth #6501 |
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January marks the launch of our new camera system LumiTop X30 AR – presented for the first time at SPIE AR/VR/MR.
Designed for precise characterization of near eye displays used in AR glasses, it combines high spatial resolution with the benefits of the LumiTop X concept: it enables very accurate luminance and color measurements through spectroradiometer based color calibration.
The system also provides detailed information on virtual image quality – such as sharpness, contrast, distortion, and uniformity – making it ideal for R&D laboratories developing next-generation AR optical systems and displays.
See detailed information in our data sheet here.
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We will also showcase:
- LumiTop X150: a high resolution imaging system with up to 600 MPx for precise analysis of Micro(O)LED displays, including pixel and sub pixel structures.
- LumiTop AR/VR: a measurement system with fields of view (FoV) up to 120°, enabling comprehensive evaluation of VR headsets across the full FoV with adjustable pupil sizes, focus settings and viewing angles.
Additionally, don't miss our upcoming talk:
"Impact of backgrounds on virtual image quality in AR glasses"
Presenter: Dr. Sascha Reinhardt
Date: 20 January 2026, 2:20–2:40 p.m. PST
Location: Room 2008 (Moscone West)
Learn how varying real-world backgrounds affect the perceived sharpness and color of virtual images in AR glasses, using precise colorimetric and contrast measurements to quantify these effects.
Stop by our booth #6501 at SPIE AR/VR/MR as we present our latest display measurement solutions for AR/VR technologies together with Konica Minolta and Radiant Vision Systems!
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\\ SPIE Photonics West 2026 – UV to NIR Metrology at High Accuracy
17–22 January 2026, Moscone Center, San Francisco
Booth #4205-60 |
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| | At the German Pavilion, we present our high-end radiometric measurement solutions and reference standards. They cover the complete spectral range from 200nm, UV -A/-B/-C through the visible into the NIR up to 2150 nm.
These systems solve demanding measurement tasks such as
- VCSEL / NIR LED testing
- IEC 62471 photobiological safety and blue-light hazard assessment
- High-accuracy UV measurements and calibrations
- Photovoltaic / solar metrology
- 2D NIR emission pattern analysis (for Face ID, driver monitoring systems (DMS) or fingerprint recognition)
- Dedicated solutions for MIL-STD-3009 & NVIS-friendly lighting assessments
Come by and meet us at booth #4205-60!
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\\ DVN Workshop 2026
4–5 February 2026, Olympiapark, Munich |
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| | | | | | “2035 Automotive Lighting: What’s Next?” | | At the 39th DVN Lighting Workshop from 4–5 February 2026 in Munich, we demonstrate how our advanced measuring systems ensure reliable testing, validation and long term stability of modern automotive exterior lighting systems, aligned with the workshop’s theme “2035 Automotive Lighting: What’s Next?”.
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\\ Asia Photonics Expo (APE) 2026
4–6 February 2026, Sands Expo and Convention Centre, Singapore
Booth #A127 (German Pavilion) |
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| | | | | | Metrology Solutions for AR/VR and MicroLED | | We invite you to visit us at APE in Singapore, booth A127 at German Pavilion, from 4–6 February 2026. We will be presenting our optical measurement solutions for AR/VR and MicroLED applications, enabling accurate characterization and development of next‑generation display technologies.
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