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| Meet us at Display Week 2026 | | | | | | | | |
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Dear Melanie,
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As display technologies continue to evolve toward higher resolutions, wider color gamuts, and AR/VR applications, measurement requirements are becoming increasingly demanding. SID Display Week is a industry’s leading global event, bringing together the full ecosystem of display technology. This year, the focus will be on AI, automotive, emissive technology, testing and measurement, and XR. Instrument Systems will present solutions designed to ensure accurate display characterization. Discover our advanced metrology solutions for near-eye display (NED) and Micro(O)LED applications, presented in collaboration with Konica Minolta Sensing Americas. Any questions? Please don’t hesitate to contact us! Your Instrument Systems Team
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5 – 7 May 2026
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\\ Display Week 2026
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Los Angeles Convention Center, South Hall, USA Booth #845
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At our booth #845, we will showcase technologies designed to bring precision, efficiency, and scalability to your display testing workflow. Discover our measurement solutions on site!
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► LumiTop X30 AR – Accurate Color at Maximum Speed Specifically designed for production testing of near-eye displays (NEDs) in AR/VR headsets. Measure displays as the human eye perceives them, combining AR lens design with spectrally corrected imaging for traceable results with lab accuracy at production speed. ► LumiTop X150 – Subpixel Accuracy up to 600 MP High-resolution imaging colorimetry for MicroLED and advanced display characterization. Resolve individual pixels and detect defects others miss. ► DMS 100 – Fast Multi-Angle Display Measurement Characterize angle-dependent display performance under real viewing conditions; flexible, fast, and built for both R&D and production environments. ► CoboTop – Automation for AR/VR Testing Repeatable, production-ready AR/VR testing powered by cobot-based positioning eliminating manual variability and scaling your workflow from prototype to production line. | | | | | | |
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7 May 2026, 5:30 p.m. | Andreas Liebel
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\\ Poster Session
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Multiple Color Matching Function 2D Colorimetry
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Also, don't miss our poster session on 7 May 2026! Modern displays with wide color gamuts and narrow-band primaries make accurate color characterization more challenging and observer-dependent. This presentation introduces an imaging-based measurement approach that delivers 2D colorimetry with multiple color matching functions (CMFs) from a single acquisition, implemented on the LumiTop imaging system. The method enables observer switching, CMF comparisons, and post-acquisition recalibration to improve color accuracy, reduce observer metamerism, and maintain consistent appearance across display technologies.
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\\ Free Ticket Codes Available
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We can offer a limited number of free ticket codes. If you are interested in attending Display Week, please contact us at Marketing@instrumentsystems.com. We look forward to seeing you at Display Week and showing you how our solutions can support your specific application. Visit us at booth 845! | | | | |
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