   | | | Newsletter September 2025
|
| |
|
| | | Dear Melanie
| |
| |
|
| |
|
| We are pleased to share our latest research in the field of optical metrology.
In our recent publication “Comparative Measurements of Near-Eye Displays (NEDs) Using a Goniophotometer and an Imaging Light Measuring Device” (Wiley Online Library), we compare two setups for the characterization of near-eye displays (NEDs) in AR/VR headsets: our high-precision Goniophotometer DMS 803 and the Imaging Light Measurement Device (ILMD) LumiTop 5300 AR/VR.
The study demonstrates that both systems provide consistent and reliable measurements for modern NEDs. Together, these measurement approaches contribute significantly to optimizing and advancing modern NED technologies and their quality control, helping manufacturers and researchers pave the way for improved VR and XR experiences.
|
| | Read Article |
|
We would also like to draw your attention to our upcoming talk at MicroLED Connect 2025.
Accurate and traceable color calibration of Imaging Light Measurement Devices (ILMDs) is a key requirement for quality control in LED-based and, increasingly, inorganic MicroLED display technologies. In his presentation on 25 September 2025 “Accuracy Optical Metrology for MicroLED Displays and Wafers”, Dr. Tobias Steinel will demonstrate how DUT-specific real-time calibration directly on the display or wafer enables ILMDs to deliver highly accurate and reliable measurement results.
Any questions? Please don't hesitate to contact us!
Your Instrument Systems Team
|
| | Contact us |
|
|
|
| |
|
| | | | | 10 - 12 September 2025 |
Shenzhen, China | | Shenzhen World Exhibition & Convention Center
Hall 3, Booth 3A40-9
Meet us at the China International Optoelectronic Exposition (CIOE), one of the world’s leading trade fairs for optoelectronic technologies. We are co-exhibiting with Giant Testing Equipment Limited. Our exhibition highlights:
Solutions for AR/VR display testing with imaging colorimeters and dedicated optics
XR test light sources compliant with IEC/IDMS standards
High-resolution LumiTop systems for OLED and µLED measurements from R&D to mass production
|
| | More |
|
|
|---|
|
| |
|
| |
|
| | |
| | | | | 24 - 25 September 2025 |
Eindhoven, The Netherlands | | High Tech Campus, Eindhoven
Booth 11
Join us at MicroLED Connect 2025, the premier industry event for MicroLED technologies. Visit our booth #11 to meet our team and learn more about high-accuracy metrology solutions tailored for MicroLED displays and wafers.
We are pleased to offer a 50% discount code for tickets to the event. Please contact us to receive your code and register at a reduced rate.
Further information to the event can be found here.
|
| | Request Code |
|
|
|---|
|
| |
|
| |
| | | |
\\ Expert Talk at MicroLED Connect 2025
|
| |
| |
| | | | | | Accuracy Optical Metrology for MicroLED Displays and Wafers | |
|
| Presenter: Dr. Tobias Steinel
Date: 25/09/2025, 1:30 p.m.
Location: High Tech Campus Eindhoven, Auditorium (Track1)
High-accuracy, traceable color calibration of Imaging Light Measurement Devices (ILMDs) is a key factor for quality control in LED-based and increasingly in inorganic MicroLED display technologies. Due to the narrow spectral bandwidth and relatively large manufacturing tolerances, traditional calibration methods often reach their limits.
In his presentation, Dr. Tobias Steinel will demonstrate how ILMDs can deliver highly accurate, traceable measurements through DUT-specific real-time calibration directly on the display or wafer. Using measurement results from MicroLED displays and wafers, he will show how the typical spectral variability of MicroLED technology can be effectively compensated; a critical step for accurate quality control.
|
| | Register here |
|
|
|---|
|
| |
|
| |
|
|
|
