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| End of January 2025 you will have an opportunity to meet Instrument Systems at two events in San Francisco, California. We will be exhibiting at Stand #6302 at SPIE AR|VR|MR as well as at Stand #4205-17 at the German Pavilion at Photonics West. On these occasions we will be presenting comprehensive solutions for optical quality control that cover the entire manufacturing process of AR/VR/XR devices: from optical modules and micro displays to final headset displays. SPIE AR|VR|MR 2024, Moscone Center in San Francisco (USA) 28–29 January 2025 Photonics West 2025, Moscone Center in San Francisco (USA) 28–30 January 2025 Meet us in San Francisco! Your Instrument Systems Team sales@instrumentsystems.com Tel.: +49-89-454943-58
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| Characterization of near-eye displays in AR/VR headsets |  | The AR/VR/MR TOP 300 optical probe imitates the human pupil when viewing individual points of XR displays. In this video, we feature it in combination with a CAS 140D spectroradiometer – a robust, compact and lightweight solution designed for simple optical tests along the production line of AR/VR/XR modules.
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 | | \\ SPIE AR|VR|MR, San Francisco, USA |
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| Highlights at SPIE AR|VR|MR 2025 |  |
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| Instrument Systems presents its comprehensive test portfolio for AR/VR/XR applications. The LumiTop AR/VR 5300 has a resolution of 24 MP and special lenses for production setups. It was specially designed for 2D testing of AR/VR/XR near eye displays in all phases of the headset manufacturing process. The TOP 300 AR/VR is an optical probe, whose optics imitate the human eye. The spotmeter offers an integrated viewfinder camera and fiber connection to a CAS series spectroradiometer. It is particularly suitable for fast optical tests within the production process of AR/VR/XR modules. The LumiTop X150 is an ultra-high resolution imaging photometer and colorimeter, and was conceived for the quality control of OLED and MicroLED displays at pixel level. 28–29 January 2025 Stand #6302
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 | | \\ SPIE Photonics West, San Francisco, USA |
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| Highlights at SPIE Photonics West 2025 |  |
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| At the parallel Photonics West, Instrument Systems will be showcasing a selection of its light measuring devices for 2D measurements in the wavelength range from UV to IR. 28–30 January 2025 Stand #4205-17 (German Pavilion)
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 | | \\ Expert presentation at Display Innovation Day on 11 Dec 2024 (online)
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| |  | Accelerated optical measurement solutions with highest accuracy for MicroLED displays and wafers |  |
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| In this presentation, Instrument Systems will explore the challenges and solutions associated with measuring and examining individual microLEDs on both displays and wafers. We will emphasize high-resolution imaging systems for light measurement, specifically designed to meet production speed requirements, ensure photometric accuracy traceable to national standards, and adapt to various DUTs. The presentation will showcase measurements and analyses with single-emitter resolution, covering both electroluminescence and photoluminescence on displays and wafers. Additionally, attendees will get a glimpse of an upcoming mass production photoluminescence wafer testing system that incorporates Instrument Systems' measurement technology.
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