  | |  | Dear Sir or Madam
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| We invite you to connect with us at Display Week 2025 in San Jose, where we’ll present our latest developments in high-precision testing and measurement solutions:
- μ(O)LED & wafer-level testing capabilities
- Advanced display testing technologies
- Dedicated setups for AR/VR/MR system evaluation
- 2D measurements for automotive applications
Also, don’t miss our expert contributions to the technical program at Display Week:
- Conference Talk: Dr. Tobias Steinel presents “Matched Moving-Window Averaging Filter” (May 14, 09:40 AM, Room LL21AB)
- Poster Spotlight: Dr. Sascha Reinhardt presents “Multi-Reference Imaging Light Measurement Device” (May 15, 04:30 PM, Room 220A)
Find us at the German Pavilion, Booth #1040, and explore how our technologies are designed to deliver accuracy, repeatability and speed.
Need a ticket? Please contact sales@instrumentsystems.com for a free exhibition pass.
Want to schedule a meeting with one of our specialists? We’d be happy to connect – just reach out to arrange a time.
We look forward to seeing you in San Jose!
Your Instrument Systems Team
sales@instrumentsystems.com
Tel.: +49-89-454943-58
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| | | \\ HIGHLIGHT: DMS 100 LIVE |
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| | | High-speed Goniometric Display Characterization
| | The DMS 100 offers a powerful solution for precise display characterization, featuring:
- Multi-angle testing with up to 16 channels of microscope optics
- Measurement of color shift and luminance across multiple viewing angles
- High-speed, high-throughput performance through CAS 140D integration
Curious about your phone’s display performance? Come test it live!
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| | \\ Expert Presentation – Dr. Tobias Steinel
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| | | | | | Matched Moving-Window Averaging Filter | |
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| Presenter: Dr. Tobias Steinel
Date: 2025/05/14, 09:40 AM
Location: San Jose Convention Center, LL21AB
Some display measurement tasks with imaging LMDs require evaluation of the target quantity exactly over the dimension of individual pixels, single lines, or columns of the display under test. This can be achieved by application of moving window average filtering for which the authors introduce a novel method of adjusting window parameters (i.e. kernel coefficients) to effectively remove unwanted periodic modulations even at sampling ratios close to the Nyquist limit.
Secure your spot now and explore innovative solutions for display measurement:
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| | | \\ Poster Spotlight – Dr. Sascha Reinhardt |
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| | | | Multi-Reference Imaging Light Measurement Device | |
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| Presenter: Dr. Sascha Reinhardt
Date: 2025/05/15, 04:30 PM
Location: San Jose Convention Center, Room 220A
Emerging display technologies, e.g. OLEDonSi, present opportunities and challenges in display metrology. A novel concept to achieve accurate color measurement for displays is presented. The solution is an imaging system equipped with a conoscopic lens with a wide field of view and multiple spectral reference spots to correct for spectral variations. By combining camera images with spectral data, the authors effectively characterize the angular color properties of the display.
Join us at the symposium for an personal and insightful discussion with our expert:
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