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| Discover our latest optical and display testing solutions at Laser World of Photonics 2025, taking place 24-27 June in Munich. Meet us in Hall A3, Booth #100 to explore the highlights of our current portfolio, including:
- Versatile Display Testing technologies
- MicroLED / MicroOLED Module & Wafer Testing
- VCSEL & IR Emitter Analysis
- Advanced Multispectral Setup (UV – SWIR)
Also, don't miss our expert talks at the SPIE Optical Metrology Conference, part of the World of Photonics Congress. Topics include:
- Comparative characterization of polarization-stable VCSELs
- Optical metrology for MicroLED mass production
If you need a free exhibition ticket, please contact us at sales@instrumentsystems.com.
Would you like to schedule a meeting with one of our experts in advance? Please send us a message at the same address. We’ll be happy to arrange an appointment.
You can find more information about Laser World of Photonics here.
We look forward to seeing you in Munich!
Your Instrument Systems Team
sales@instrumentsystems.com
Tel.: +49-89-454943-58
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| | | \\ OUR TOPICS AT LASER MUNICH 2025 |
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| | | Versatile Display Testing Technologies
| | Optimized for production environments, the LumiTop X20 (20 MP) and X30 (31 MP) offer high-resolution, spectrally corrected 2D imaging with motorized focus, and switchable density filter. They enable accurate color and luminance measurements from ultra-low (0.001 cd/m²) up to Mcd/m², supporting visual performance testing under realistic viewing conditions.
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| | | MicroLED / MicroOLED Module & Wafer Testing
| | The LumiTop system with Microscope lens enables high-resolution, spectrally accurate single pixel evaluation (SPE) for MicroLED, MicroOLED, and wafer-level applications. Each individual emitter is analyzed for luminance, chromaticity, dominant wavelength, pixel geometry, and emitting area. This allows for detailed defect detection, binning, and calibration – optimized for production environments with tight takt times.
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| | | VCSEL / IR Emitter Analysis
| | The VTC 2400 is a high-resolution infrared camera designed for 2D far-field analysis of the radiant intensity distribution of VCSELs and IR emitters. It uses a diffusely scattering screen and a monochrome NIR camera to capture spatial radiation patterns in a single measurement. The system is calibrated to convert irradiance into radiant intensity and is suitable for both lab and production environments.
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| | | Advanced Multispectral Setup (UV – SWIR)
| | Our multispectral setup combines different CAS spectroradiometer models to cover a wide wavelength range from UV to SWIR in a single measurement. The system offers high sensitivity, low stray light and proven reliability across the spectrum. The MultiCAS module of the respective analytical software SpecWin Pro ensures user-friendly evaluation with all measurement data in a unified measurement curve.
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| | \\ EXPERT TALKS AT SPIE OPTICAL METROLOGY CONFERENCE
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| | | | | | Comparative Characterization of Polarization-Stable VCSELs | |
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| Presenter: Dr. Frank Münchow
Date: 24 June 2025, 2:30 PM
Location: International Congress Center Messe München, Room 22a
Dr. Frank Münchow compares two metrology approaches to determine Angle and Degree of Polarization of VCSELs: the traditional rotating waveplate technique and an advanced one-shot solution.
Secure your spot now!
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| | | | | | Optical Metrology for Mass Production of MicroLED Displays & Wafers | |
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| Presenter: Dr. Roland Schanz
Date: 26 June 2025, 5:20 PM
Location: International Congress Center Messe München, Room 14c
Dr. Roland Schanz presents a breakthrough in MicroLED wafer metrology: Learn how an autocalibrating imaging light measurement system combined with photoluminescence microscopy enables fast, contactless optical testing of millions of LEDs – with spectrometer-level accuracy in just minutes.
Secure your spot now!
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