  | |  | Dear Sir or Madam
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| In January, Instrument Systems will be prominently represented in San Francisco. We look forward to welcoming you at Photonics West as well as at the concurrent SPIE.AR|VR|MR.
We will be showcasing solutions for optical quality assurance along the entire production chain of AR/VR devices: Starting with individual modules and flat displays right up to the installed curved headset displays. Our VTC infrared cameras support you in testing 3D gesture recognition sensors. At both events, Instrument Systems will also contribute with lectures about exciting applications.
Photonics West 2024, Moscone Center in San Francisco (USA)
30 January - 1 February 2024
Booth 4205-12
SPIE.AR|VR|MR 2024, Moscone Center in San Francisco (USA)
30 - 31 January 2024
Booth 6101
Join us in San Francisco!
Your Instrument Systems Team
sales@instrumentsystems.com
Tel.: +49-89-454943-0
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| Two-dimensional LIV, Spectrum and Beam Characterization of Individual Emitters in a VCSEL Array
| | We extended existing one-dimensional LIV test, spectral and beam analysis to each single emitter of a VCSEL array. This approach allows parallelization of the measurements, which reduces overall measurement time, and offers investigation on the cross-talk between individual emitters. Such comprehensive characterization of individual emitters is crucial for demanding applications such as facial recognition, 3D sensing, in cabin sensing, LiDAR and ranging.
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| | | \\ Photonics West, San Francisco, USA |
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| | Highlights at Photonics West 2024 | |
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| Instrument Systems will be presenting its extensive test portfolio for IR emitters and VCSELs. New product developments in the VTC cameras cater for the rapidly growing market for VCSEL production for the short-wave infrared range from 780 to 1700 nm. The VTC 4000 near-field camera enables polarization-controlled characterization of the individual emitters of a VCSEL array by the one-shot process. The VTC 2400 far-field camera was specially developed for production-capable testing of laser-based components such as LiDAR systems.
30 January - 1 February 2024
Booth 4205-12
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| Expert lecture at Photonics West 2024 | |
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| One-shot single-emitter-resolved polarization and LIV+λ characterization of a VCSEL array at tempered conditions
For VCSEL arrays with the existing solutions, it is hardly possible and timely expensive to perform LIV+λ measurements since there are few up to some hundreds of single emitters within the array. Furthermore, polarized VCSEL arrays are unique and have potential applications, which then requires not only the LIV+λ but also polarization measurement of each emitter. Therefore, in this study, not only we extended the LIV+λ measurements to each individual emitters in a VCSEL array but also their polarization is measured. In order to characterize the stability of the VCSEL array in various environmental conditions, all the measurements were done further at multiple temperatures. The design offers fast one-shot and comprehensive characterization of emitters of VCSEL arrays, allowing parallelization of the measurements to reduce overall measurement time and to determine damaged or out of spec VCSELs at early stage of the manufacturing process.
31 January 2024, 11:35 am (GMT-7)
Session 12904-11
by Dr. Amir Sharghi
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| | | \\ SPIE.AR|VR|MR, San Francisco, USA |
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| | Highlights at SPIE.AR|VR|MR 2024 | |
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| At the concurrent SPIE.AR|VR|MR exhibition, Instrument Systems will demonstrate its light measurement devices for a perfect AR/VR world:
The new TOP 300 AR/VR is an optical probe with optics that mimics the human eye. The spot meter offers an integrated view finder camera and a fiber based connection to a CAS spectroradiometer. It’s especially designed for simple optical tests along the production line of AR/VR modules.
The new LumiTop 5300 AR/VR has a higher resolution (24 MP) and a straight lens for special production set-ups. It’s especially designed for 2D testing AR/VR display modules before installing into the headset.
The spectrally enhanced LumiTop 4000 AR/VR (12 MP) with periscope lens permits parallel two-eye measurements for displays in the AR/VR headset. It’s especially designed for 2D testing of installed AR/VR displays.
30 - 31 January 2024
Booth 6101
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| | Expert lectures at SPIE.AR|VR|MR 2024 | |
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| Safety assessment of virtual reality eye tracking modules
VR devices widely use multiple near-infrared LEDs for eye tracking. However, NIR illumination is potentially harmful to the human eye and skin. The international photo biological safety standard IEC 62471 provides guidelines for evaluating the photo biological hazards of incoherent broadband light sources.
29 January 2024, 3:50 pm (GMT-7)
Session 12913-55
by Dr. Amir Sharghi
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| Light measurement and quality control at different production stages of a virtual reality headset
The production of a Virtual Reality headset is a complex process with several steps. At each step, various meas-urements are taken to verify quality or to characterize the component for later use. The visual system is the key component of a VR headset and consists in general of a display and an optical lens, which form the optical module.
29 January 2024, 10:50 am (GMT-7)
Session 12913-45
by Dr. Tobias Steinel
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| | \\ Featured Article in Electro Optics 11/23
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| | | | Speed of light | |
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| As microLED technology has matured, it has become increasingly popular for display applications. The ability to create high-resolution, high contrast displays with true blacks and vibrant colors makes these displays desirable for smartphones, televisions, and wearable devices such as smartwatches and augmented reality (AR) glasses, as they offer improved display quality in a smaller form factor. The challenges, however, emerge when it comes to the mass transfer of microLEDs from wafers to displays at the same time as maintaining optical quality control at every step. The importance of testing cannot be overestimated. The quality of each individual diode can be pivotal in determining the overall performance of displays. Even minor defects or variations can result in color inaccuracies, reduced brightness, or display malfunctions.
Published in Electro Optics 11/23:
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